Microchannel Plate Gate Upgrade Module for Atom Probe Microscope

The National Institute of Standards and Technology (NIST) requires a microchannel plate gate (MCP gate) module upgrade for their existing LEAP 4000 X-Si atom probe microscope (S/N 5020). This upgrade is intended to support NIST's mission within the Material Measurement Laboratory (MML) to perform measurement science for the domestic semiconductor industry, specifically focusing on atom probe tomography (APT) to study laser wavelength effects on semiconductor materials. The MCP gate module will enable the instrument to maintain high sensitivity by employing a nanosecond high-voltage pulse to gate the MCP detector, preventing saturation from intense signals. It will allow for fast switching of MCP amplification to ignore specific signals within a defined time-of-flight (TOF) window, without affecting the electric fields within the TOF mass spectrometer. The module must accommodate pulse frequencies from 100 kHz to 200 kHz and be fully integrated into the existing CAMECA LEAP 4000 X-Si instrument, controlled via a digital delay generator supplied by NIST. NIST has conducted market research and identified CAMECA Instruments, Inc. as the likely sole source capable of meeting these requirements due to compatibility with existing equipment. The upgrade includes all necessary hardware such as high voltage supply, timing electronics, and cables, and will be covered under a minimum one-year warranty for parts, software, and labor.