Sources Sought: Second Harmonic Generation Microscope

The National Institute of Standards and Technology (NIST) is conducting market research to identify potential sources for a Second Harmonic Generation Microscope. The requirement is for a scanning confocal microscope configured with a pulsed laser source and second harmonic detector. Components may be used or refurbished. The laser should have a pulse duration of less than 200 fs, a center wavelength of approximately 800 nm with a tuning range of approximately 200 nm, and an average power greater than 1 W. The microscope must support imaging of electrically poled domains in thin-film lithium niobate by detecting the reflected second harmonic light generated in the sample. NIST is interested in responses from all responsible sources, including small and large businesses. Vendors are requested to submit a capability statement detailing their company information, manufacturing country, product specifications, lead times, and any other relevant information. The NAICS code for this opportunity is 334516, Analytical Laboratory Instrument Manufacturing, with a small business size standard of 1,000 employees. Responses are due by May 18, 2026.