Environmental Test Chamber for Reliability Testing

The National Institute of Standards and Technology (NIST), Engineering Laboratory, is seeking a brand name only environmental test chamber to stress devices with repeated cycles of extreme hot and cold temperatures. This chamber will simulate years of wear and tear in a few days or weeks, allowing researchers to observe material and device degradation for defect characterization and failure analysis. The system will be used for metrology development, including image acquisition, processing, and optimization, in support of the CHIPS Metrology program. The required environmental test chamber must be a benchtop compact unit with a refrigeration system, heating and air delivery system, and a dry air purge system. It should have interior walls, ceiling, and floor constructed with 304 stainless steel, with continuously welded seams. Exterior dimensions should not exceed W x D x H (mm): 1000 x 600 x 900, with a minimum interior volume of 34 liters and a weight not exceeding 130kg. The chamber must accommodate at least one 200 mm wafer, include a cable port, a viewing window with a light monitor, a vent port, and at least one stainless steel wire rod shelf. The system must be capable of cooling to -65 degC or lower and heating to 175 degC or higher, with the ability to thermal cycle between these temperatures and test samples with live load. The control system must include process view software, ethernet communications, data logging, graphical trend charting, visual and audible notification, and email alerts. Safety features must include high/low limit over/under temperature protection, and the control panel must be UL508A listed. A certificate of calibration is required.